Ultrasharp tips for atomic force microscopy
Atomic force microscopes scan the surfaces of samples in the nanoworld. The fine probe tips of the microscope are expensive consumables. Amit Kumar Sachan and Renato Zenobi have adapted a microelectronic process, which is fast and cheap in producing probe tips from metal wire.
Contact / Links:
Professor Renato Zenobi, Zenobi Group
Patent pending (please contact ETH transfer for further information: )
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